IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-chip circuit for measuring jitter and skew with picosecond resolution

2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT)

Author(s): K.A. Jenkins ; A.P. Jose ; Z. Xu ; K.L. Shepard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Austin, TX, USA
Conference Date: 2 June 2008
Page(s): 257 - 260
ISBN (CD): 978-1-4244-1811-4
ISBN (Paper): 978-1-4244-1810-7
DOI: 10.1109/ICICDT.2008.4567290
Regular:

A circuit for on-chip measurement of long-term jitter, period jitter, and clock skew, is demonstrated. The circuit uses a single latch and a voltage-controlled delay element, and is evaluated in a... View More

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