IEEE - Institute of Electrical and Electronics Engineers, Inc. - Real-time neutron and alpha soft-error rate testing of CMOS 130nm SRAM: Altitude versus underground measurements

2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT)

Author(s): J.L. Autran ; P. Roche ; S. Sauze ; G. Gasiot ; D. Munteanu ; P. Loaiza ; M. Zampaolo ; J. Borel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Austin, TX, USA
Conference Date: 2 June 2008
Page(s): 233 - 236
ISBN (CD): 978-1-4244-1811-4
ISBN (Paper): 978-1-4244-1810-7
DOI: 10.1109/ICICDT.2008.4567284
Regular:

This work reports real-time soft-error rate (SER) testing of semiconductor static memories in both altitude and underground environments to separate the component of the SER induced by the cosmic... View More

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