IEEE - Institute of Electrical and Electronics Engineers, Inc. - Probabilistic modeling of nanoscale adder

2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT)

Author(s): Xiaojun Lu ; Jianping Li ; Guowu Yang ; Xiaoyu Song
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Austin, TX, USA
Conference Date: 2 June 2008
Page(s): 219 - 222
ISBN (CD): 978-1-4244-1811-4
ISBN (Paper): 978-1-4244-1810-7
DOI: 10.1109/ICICDT.2008.4567282
Regular:

This paper presents the probabilistic logic model to compute the probability distribution of the nano gate states. The characterization is based on the Markov random field and statistic physics.... View More

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