IEEE - Institute of Electrical and Electronics Engineers, Inc. - The future of flash memory: Is floating gate technology doomed to lose the race?

2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT)

Author(s): D. Wellekens ; J. Van Houdt
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Austin, TX, USA
Conference Date: 2 June 2008
Page(s): 189 - 194
ISBN (CD): 978-1-4244-1811-4
ISBN (Paper): 978-1-4244-1810-7
DOI: 10.1109/ICICDT.2008.4567276
Regular:

Since the very beginning of the flash memory era, the market has been dominated by the floating gate technology. However, as floating gate flash continues along a very steep scaling path, more and... View More

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