IEEE - Institute of Electrical and Electronics Engineers, Inc. - SOI chip design and charging damage

2008 IEEE International Conference on IC Design and Technology & Tutorial (ICICDT)

Author(s): T.B. Hook
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Austin, TX, USA
Conference Date: 2 June 2008
Page(s): 83 - 86
ISBN (CD): 978-1-4244-1811-4
ISBN (Paper): 978-1-4244-1810-7
DOI: 10.1109/ICICDT.2008.4567252
Regular:

In this paper we discuss some aspects of antennas in real designs in SOI technology, and show how the concepts manifest themselves in actual chips, where second-order effects such as resistance... View More

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