IEEE - Institute of Electrical and Electronics Engineers, Inc. - The study of electric field effect to bending on the growth of the primary root of rice

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): T. Rotcharoen ; W. Khan-ngern ; S. Nitta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 794 - 798
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559995
Regular:

The growing of rice seeds (Oryza sativa L.) on a primary root stage are experimented under the condition with electric field at 28.5 kV/m varied electrode in horizontal... View More

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