IEEE - Institute of Electrical and Electronics Engineers, Inc. - Universal electric and magnetic field analyzer system

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): Yong Cheh Ho ; D. Pommerenke ; Tun Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 391 - 394
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559894
Regular:

Near-field probing is often used to determine the sources and coupling paths of an electromagnetic interference problem above a printed circuit board or integrated circuits chip. A wideband... View More

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