IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automation of radiated emission measurements with an ultra-fast time-domain EMI measurement system

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): S. Braun ; A. Frech ; H.H. Slim ; P. Russer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 303 - 306
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559872
Regular:

Traditionally emission measurements are performed in frequency domain and take a long time for a single scan. Pre- and final scans are performed to reduce the time for the characterization of the... View More

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