IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automation of radiated emission measurements with an ultra-fast time-domain EMI measurement system
2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility
Author(s): | S. Braun ; A. Frech ; H.H. Slim ; P. Russer |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 May 2008 |
Conference Location: | Singapore, Singapore |
Conference Date: | 19 May 2008 |
Page(s): | 303 - 306 |
ISBN (CD): | 978-981-08-0629-3 |
DOI: | 10.1109/APEMC.2008.4559872 |
Regular:
Traditionally emission measurements are performed in frequency domain and take a long time for a single scan. Pre- and final scans are performed to reduce the time for the characterization of the... View More