IEEE - Institute of Electrical and Electronics Engineers, Inc. - Better measurement uncertainty using fully digital receivers in EMC emission tests

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): D. Festa ; R. Grego ; M. Zingarelli
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 299 - 302
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559871
Regular:

Uncertainty is becoming more and more important in EMC tests. Compared to traditional analogue equipment, a new generation of fully digital receivers may represent a significant improvement in... View More

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