IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of GTEM cells for IC EMC testing

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): R. Heinrich ; V. Mullerwiebus ; A. Lange ; B. Deutschmann ; U. Karsten ; F. Klotz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 263 - 266
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559862
Regular:

A test object for investigation and comparison of different IC EMC test facilities (muTEM and GTEM cell) has been designed. The test board allows the characterization of the test facility directly... View More

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