IEEE - Institute of Electrical and Electronics Engineers, Inc. - IC emission spectrum drifts after burn-in cycles

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): S. Ben Dhia ; A.C. Ndoye ; A. Boyer ; L. Guillot ; B. Vrignon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 255 - 258
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559860
Regular:

As device lifetime tends to decrease with CMOS nanometric technologies, new degradation mechanisms at device level could involve a drift in IC electromagnetic behavior. This paper presents the... View More

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