IEEE - Institute of Electrical and Electronics Engineers, Inc. - SA/SAR analysis for multiple UWB pulse exposure

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): Qiong Wang ; Jianqing Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 212 - 215
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559849
Regular:

With the rapid progress of electronic and information technology, an expectation for the realization of body area network (BAN) by means of ultra wide band (UWB) techniques has risen. Although the... View More

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