IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact of partial EBG PDN on PI, SI and lumped model-based correlation

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): Junho Lee ; Hyungdong Lee ; Kunwoo Park ; Byongtae Chung ; Jaemin Kim ; Joungho Kim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 168 - 171
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559838
Regular:

In this paper, design, modeling and impact of a partial electromagnetic band-gap (EBG) power distribution network (PDN) using remnants of the signal layer in a multilayer printed circuit board... View More

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