IEEE - Institute of Electrical and Electronics Engineers, Inc. - Relationship between breakdown field and radiated electromagnetic field strength due to low voltage ESD below 1kV

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): K. Kawamata ; S. Minegishi ; A. Haga ; O. Fujiwara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 140 - 143
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559831
Regular:

Relationship between breakdown field strength and radiated electromagnetic field strength was examined in experimental study. In the first, transition duration of voltage and current rise time due... View More

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