IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel Specific Absorption Rate measurement techniques

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): T. Onishi ; K. Kiminami ; T. Iyama
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 120 - 123
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559826
Regular:

This paper presents two specific absorption rate (SAR) measurement techniques, the electro-optic (EO) probe and a SAR estimation method. A prototype of the three-axis EO probe is developed for SAR... View More

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