IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modelling of the susceptibility of 90 nm input output buffer

2008 1st Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) & 19th International Zurich Symposium on Electromagnetic Compatibility

Author(s): A. Boyer ; M. Fer ; L. Courau ; E. Sicard ; S. BenDhia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Singapore, Singapore
Conference Date: 19 May 2008
Page(s): 32 - 35
ISBN (CD): 978-981-08-0629-3
DOI: 10.1109/APEMC.2008.4559804
Regular:

This paper deals with the modelling of the susceptibility to RF aggression of several input buffers structures implemented in a 90 nm test-chip. Measurement results, model construction and... View More

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