IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluating the quality of super-resolved images for face recognition

2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops)

Author(s): Xiaoli Zhou ; Bir Bhanu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anchorage, AK, USA
Conference Date: 23 June 2008
Page(s): 1 - 8
ISBN (CD): 978-1-4244-2340-8
ISBN (Paper): 978-1-4244-2339-2
ISSN (Paper): 2160-7508
DOI: 10.1109/CVPRW.2008.4563128
Regular:

The widespread use of super-resolution methods, in a variety of applications such as surveillance has led to an increasing need for or quality assessment measures. The current quality measures aim... View More

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