IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predicting biometric facial recognition failure with similarity surfaces and support vector machines

2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops)

Author(s): W.J. Scheirer ; A. Bendale ; T.E. Boult
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anchorage, AK, USA
Conference Date: 23 June 2008
Page(s): 1 - 8
ISBN (CD): 978-1-4244-2340-8
ISBN (Paper): 978-1-4244-2339-2
ISSN (Paper): 2160-7508
DOI: 10.1109/CVPRW.2008.4563124
Regular:

The notion of quality in biometric system evaluation has often been restricted to raw image quality, with a prediction of failure leaving no other option but to acquire another sample image of the... View More

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