IEEE - Institute of Electrical and Electronics Engineers, Inc. - Full orientation invariance and improved feature selectivity of 3D SIFT with application to medical image analysis

2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops)

Author(s): S. Allaire ; J.J. Kim ; S.L. Breen ; D.A. Jaffray ; V. Pekar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anchorage, AK, USA
Conference Date: 23 June 2008
Page(s): 1 - 8
ISBN (CD): 978-1-4244-2340-8
ISBN (Paper): 978-1-4244-2339-2
ISSN (Paper): 2160-7508
DOI: 10.1109/CVPRW.2008.4563023
Regular:

This paper presents a comprehensive extension of the Scale Invariant Feature Transform (SIFT), originally introduced in 2D, to volumetric images. While tackling the significant computational... View More

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