IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-supervised SVM batch mode active learning for image retrieval

2008 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Author(s): S.C.H. Hoi ; Rong Jin ; Jianke Zhu ; M.R. Lyu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anchorage, AK, USA
Conference Date: 23 June 2008
Page(s): 1 - 7
ISBN (CD): 978-1-4244-2243-2
ISBN (Paper): 978-1-4244-2242-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.2008.4587350
Regular:

Active learning has been shown as a key technique for improving content-based image retrieval (CBIR) performance. Among various methods, support vector machine (SVM) active learning is popular for... View More

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