IEEE - Institute of Electrical and Electronics Engineers, Inc. - Auto flash performance test using exposure accuracy

2008 IEEE International Symposium on Consumer Electronics - (ISCE 2008)

Author(s): Kwang Yeol Park ; Hyung Ju Park ; Young Ho Son ; Dong Hwan Har
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Vilamoura, Portugal
Conference Date: 14 April 2008
Page(s): 1 - 4
ISBN (CD): 978-1-4244-2422-1
DOI: 10.1109/ISCE.2008.4559453
Regular:

General auto flash focuses on representing the actual object luminance depending on the object's luminance condition, that is, whether it is dark or bright. Although it is an intelligent... View More

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