IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Coverage-Driven Constraint Random-Based Functional Verification Method of Memory Controller

2008 19th IEEE/IFIP International Symposium on Rapid System Prototyping

Author(s): Yingpan Wu ; Lixin Yu ; Lidong Lan ; Haiyang Zhou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Monterey, CA, USA
Conference Date: 2 June 2008
Page(s): 99 - 104
ISBN (Paper): 978-0-7695-3180-9
ISSN (Paper): 1074-6005
DOI: 10.1109/RSP.2008.12
Regular:

This paper presents a coverage-driven Constraint random-based functional verification method of memory controller in a microprocessor. Many special functions are integrated into this memory... View More

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