IEEE - Institute of Electrical and Electronics Engineers, Inc. - Functional DIF for Rapid Prototyping

2008 19th IEEE/IFIP International Symposium on Rapid System Prototyping

Author(s): W. Plishker ; N. Sane ; M. Kiemb ; K. Anand ; S.S. Bhattacharyya
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Monterey, CA, USA
Conference Date: 2 June 2008
Page(s): 17 - 23
ISBN (Paper): 978-0-7695-3180-9
ISSN (Paper): 1074-6005
DOI: 10.1109/RSP.2008.32
Regular:

Dataflow formalisms have provided designers of digital signal processing systems with optimizations and guarantees to arrive at quality prototypes quickly. As system complexity increases,... View More

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