IEEE - Institute of Electrical and Electronics Engineers, Inc. - Guided Problem Diagnosis through Active Learning

2008 International Conference on Autonomic Computing (ICAC '08)

Author(s): Songyun Duan ; S. Babu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Chicago, IL, USA
Conference Date: 2 June 2008
Page(s): 45 - 54
ISBN (CD): 978-0-7695-3175-5
DOI: 10.1109/ICAC.2008.28
Regular:

There is widespread interest today in developing tools that can diagnose the cause of a system failure accurately and efficiently based on monitoring data collected from the system. Over time, the... View More

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