IEEE - Institute of Electrical and Electronics Engineers, Inc. - Novel hot-carrier AC-DC design guidelines for advanced CMOS nodes

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): C. Guerin ; V. Huard ; C. Parthasarathy ; J.M. Roux ; A. Bravaix ; E. Vincent
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 741 - 742
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4559016
Regular:

The understanding of the relationship between circuit lifetime and device DC hot carrier (HC) stress lifetime is becoming increasingly important for advanced nodes since supply voltage (Vdd) and... View More

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