IEEE - Institute of Electrical and Electronics Engineers, Inc. - Picosecond laser microscopy for investigating localization of alpha particle induced soft error rates in deep submicron CMOS VLSI

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): J.S. Laird ; Y. Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 731 - 732
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4559011
Regular:

Alpha-particle induced soft error rates (SER) due to naturally occurring radioisotopes in process metals are a serious reliability issue for deep-submicron CMOS technologies where continued... View More

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