IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simultaneous measurement of soft error rate of 90 nm CMOS SRAM and cosmic ray neutron spectra at the summit of Mauna Kea

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Y. Tosaka ; R. Takasu ; T. Uemura ; H. Ehara ; H. Matsuyama ; S. Satoh ; A. Kawai ; M. Hayashi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 727 - 728
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4559009
Regular:

We carried out simultaneous measurement of SERs and cosmic ray neutron spectra for the first time. We measured SERs using 90 nm CMOS SRAM chips and measured neutron spectra using a Bonner... View More

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