IEEE - Institute of Electrical and Electronics Engineers, Inc. - Supply signal fluctuations due to chip power grid resonance — a new reliability concern

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): M. Gurfinkel ; P. Livshits ; A. Rozen ; Y. Fefer ; J.B. Bernstein ; Y. Shapira
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 721 - 722
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4559006
Regular:

On-die measurements of VDD and VSS signals inside a 90 nm technology chip are presented. The results show fluctuations in the VDD and VSS signals, which... View More

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