IEEE - Institute of Electrical and Electronics Engineers, Inc. - study of incremental step pulse programming (ISPP) and STI edge effect of BE-SONOS NAND Flash

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Hang-Ting Lue ; Tzu-Hsuan Hsu ; Szu-Yu Wang ; Erh-Kun Lai ; Kuang-Yeu Hsieh ; R. Liu ; Chih-Yuan Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 693 - 694
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558992
Regular:

Incremental-step-pulse programming (ISPP) is a key enabler for achieving tight VT distribution for MLC NAND Flash. The ISPP characteristics for BE-SONOS NAND Flash are studied... View More

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