IEEE - Institute of Electrical and Electronics Engineers, Inc. - Acomprehensive compact SCR model for CDM ESD circuit simulation

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Lifang Lou ; J.J. Liou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 635 - 636
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558963
Regular:

We have presented a comprehensive SCR compact model for CDM simulation. The work illustrated the useful and effective macromodeling approach of integrating the various industry standard models to... View More

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