IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-Chip circuit for monitoring frequency degradation due to NBTI

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): K. Stawiasz ; K.A. Jenkins ; Pong-Fei Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 532 - 535
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558941
Regular:

This work describes the design and characterization of a unique circuit which can be easily integrated into a microprocessor product in order to determine the degradation of circuit speed caused... View More

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