IEEE - Institute of Electrical and Electronics Engineers, Inc. - Circuit failure prediction for robust system design in scaled CMOS

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): S. Mitra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 524 - 531
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558940
Regular:

The idea behind circuit failure prediction is to predict the occurrence of a circuit failure before errors actually appear in system data and states. This concept enables a sea change in robust... View More

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