IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability considerations for implantable medical ICs

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): M. Porter ; P. Gerrish ; L. Tyler ; S. Murray ; R. Mauriello ; F. Soto ; G. Phetteplace ; S. Hareland
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 516 - 523
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558939
Regular:

Implantable medical devices continue to grow in complexity, mirroring the ascent of the semiconductor industry along the Moorepsilas Law curve. Traditionally, implantable applications have taken a... View More

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