IEEE - Institute of Electrical and Electronics Engineers, Inc. - Soft error reliability improvements for implantable medical devices

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): M. Porter ; J. Wilkinson ; K. Walsh ; B. Sierawski ; K. Warren ; R.A. Reed ; G. Vizkelethy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 488 - 491
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558934
Regular:

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