IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of accelerated DRAM soft error rates measured at component and system level

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): L. Borucki ; G. Schindlbeck ; C. Slayman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 482 - 487
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558933
Regular:

Single event upsets from terrestrial cosmic rays (i.e. high-energy neutrons) are more important than alpha particle induced soft errors in modern DRAM devices. A high intensity broad spectrum... View More

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