IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): K.M. Warren ; J.D. Wilkinson ; R.A. Weller ; B.D. Sierawski ; R.A. Reed ; M.E. Porter ; M.H. Mendenhall ; R.D. Schrimpf ; L.W. Massengill
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 473 - 477
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558931
Regular:

In this work, heavy ion and energetic proton single event upset (SEU) cross sections are measured for a 4 Mbit CMOS, static random access memory (SRAM). Heavy ion upset cross sections were used to... View More

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