IEEE - Institute of Electrical and Electronics Engineers, Inc. - Combined optical and electrical analysis of AlGaN-based deep-UV LEDs reliability

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): M. Meneghini ; N. Trivellin ; L. Trevisanello ; A. Lunev ; Jinwei Yang ; Y. Bilenko ; Wenhong Sun ; M. Shatalov ; R. Gaska ; E. Zanoni ; G. Meneghesso
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 441 - 445
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558925
Regular:

This paper describes an analysis of the reliability of AlGaN-based deep-UV Light-Emitting Diodes (LEDs) emitting in the range 280-340 nm. LEDs have been aged at their nominal operating current,... View More

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