IEEE - Institute of Electrical and Electronics Engineers, Inc. - A capacitance reliability degradation mechanism in Hyper-abrupt junction varactors

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): W. Abadeer ; R. Rassel ; J.B. Johnson
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 310 - 314
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558903
Regular:

Junction varactors form key passive components for RF and analog application where capacitance could be tuned by a control voltage. This paper details and models a reliability degradation... View More

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