IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling of majority and minority carrier triggered external latchup

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): F. Farbiz ; E. Rosenbaum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 270 - 277
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558897
Regular:

Circuit models are presented that allow one to identify the worst-case testing condition for external latchup and to simulate the value of the latchup trigger current. The models are valid under... View More

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