IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study of undoped channel FinFETs in active rail clamp ESD networks

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): M.G. Khazhinsky ; M.M. Chowdhury ; D. Tekleab ; L. Mathew ; J.W. Miller
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 262 - 269
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558896
Regular:

In this paper we investigate state-of-the-art undoped channel FinFETs and FinDiodes with an emphasis on I/O and ESD applicability. Utilizing electrical characterization data, 3D TCAD, and a... View More

Advertisement