IEEE - Institute of Electrical and Electronics Engineers, Inc. - A scalable SCR compact model for ESD circuit simulation

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): J. Di Sarro ; E. Rosenbaum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 254 - 261
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558895
Regular:

A scalable, compact model for SCR-based ESD-protection devices, which can simulate transient voltage overshoots observed on the timescale of charged device model (CDM) events, is presented. This... View More

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