IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transient behavior of SCRS during ESD pulses

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): K. Esmark ; H. Gossner ; S. Bychikhin ; D. Pogany ; C. Russ ; G. Langguth ; E. Gornik
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 247 - 253
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558894
Regular:

Silicon controlled rectifiers (SCRs) are widely used ESD protection elements exhibiting extremely good voltage clamping and high failure current threshold. However, the turn-on behavior of the SCR... View More

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