IEEE - Institute of Electrical and Electronics Engineers, Inc. - Second breakdown behavior in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubes

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): D. Johnsson ; W. Mamanee ; S. Bychikhin ; D. Pogany ; E. Gornik ; M. Stecher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 240 - 246
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558893
Regular:

Bipolar ESD protection devices subjected to low current long pulse stress can sustain a relatively long time during thermal second breakdown without any damage. The effect is related to a... View More

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