IEEE - Institute of Electrical and Electronics Engineers, Inc. - A multi-bit error detection scheme for DRAM using partial sums with parallel counters

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): B. Narasimham ; W.K. Luk
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 202 - 205
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558886
Regular:

Multi-bit soft errors are a key reliability concern for advanced technology memories. Along with soft errors, multi-bit retention errors due to leakage are also a concern for DRAM memory. We have... View More

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