IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability and radiation effects in IC technologies

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): R.D. Schrimpf ; K.M. Warren ; R.A. Weller ; R.A. Reed ; L.W. Massengill ; M.L. Alles ; D.M. Fleetwood ; X.J. Zhou ; L. Tsetseris ; S.T. Pantelides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 97 - 106
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558869
Regular:

The reliability of advanced integrated circuit (IC) technologies may be dominated by the interaction of environmental radiation with the devices in the ICs. In particular, single event upsets... View More

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