IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel multi-point NBTI characterization methodology using Smart Intermediate Stress (SIS)

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): C. Schlunder ; M. Hoffmann ; R.-P. Vollertsen ; G. Schindler ; W. Heinrigs ; W. Gustin ; H. Reisinger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 79 - 86
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558867
Regular:

In recent literature several measurement methods were introduced to characterize the Vth-degradation due to NBTI considering the recovery phenomenon. To our knowledge each method has a... View More

Advertisement