IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurements for the reliability and electrical characterization of semiconductor nanowires

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): C.A. Richter ; H.D. Xiong ; Xiaoxiao Zhu ; Wenyong Wang ; V.M. Stanford ; Qiliang Li ; D.E. Ioannou ; Woong-Ki Hong ; Takhee Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 39 - 45
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558860
Regular:

Nanoelectronic devices based upon self-assembled semiconductor nanowires are excellent research tools for investigating the behavior of structures with sub-lithographic features as well as a... View More

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