IEEE - Institute of Electrical and Electronics Engineers, Inc. - An energy-level perspective of bias temperature instability

2008 IEEE International Reliability Physics Symposium (IRPS)

Author(s): T. Grasser ; B. Kaczer ; W. Goes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Phoenix, AZ, USA
Conference Date: 27 April 2008
Page(s): 28 - 38
ISBN (CD): 978-1-4244-2050-6
ISBN (Paper): 978-1-4244-2049-0
DOI: 10.1109/RELPHY.2008.4558859
Regular:

Many recent publications discussing the stress and recovery behavior of bias temperature instability (BTI) have suggested the existence of two components contributing to the phenomenon. One of... View More

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