IEEE - Institute of Electrical and Electronics Engineers, Inc. - Assessing extreme values in political risk estimates

IEEE Systems and Information Engineering Design Symposium (SIEDS 2008)

Author(s): C. Nganga ; E. Curo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Charlottesville, VA, USA
Conference Date: 25 April 2008
Page(s): 306 - 310
ISBN (CD): 978-1-4244-2366-8
ISBN (Paper): 978-1-4244-2365-1
DOI: 10.1109/SIEDS.2008.4559730
Regular:

With the increasing integration of world markets, it is important to understand the impact of political risk on financial portfolios. Current research on the influence of political risk on... View More

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