IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compositional verification of retiming and sequential optimizations

2008 45th ACM/IEEE Design Automation Conference

Author(s): In-Ho Moon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anaheim, CA, USA
Conference Date: 8 June 2008
Page(s): 131 - 136
ISBN (Paper): 978-1-60558-115-6
ISSN (Paper): 0738-100X
Regular:

Once a design is both retimed and sequentially optimized, sequential equivalence verification becomes very hard since retiming breaks the equivalence of the retimed sub-blocks although the design... View More

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